Ph 448 Electronic materials and device characterization

A state-of-the-art microprocessor chip consists of over 4 billion transistors. Hundreds of steps are involved in fabrication of these devices and any defect at any one of these steps will affect the device performance. Hence, characterization or metrology technology has been developed to inspect the wafers at each step to catch any possible faulty fabrication process. This course examines the different electrical and optical techniques that are being used in the industry to evaluate the properties and performance of electronic materials and devices.