ECE 675 Introduction to Integrated Circuit Test

Course will cover the traditional role of IC test in parametric and functional testing and the changing role of IC testing in semiconductor design and manufacturing. The course is divided into three parts. The first part reviews integrated circuit technologies and fault modeling. The second introduces digital IC test, DC parametric testing, and functional and structural testing. The third part examines technology trends. Also offered as ECE 575 and may be taken only once for credit.